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Lee, Cho, and Cho: Microleakage of 2-step adhesive systems in diamond-prepared cavity
Original Article
Journal of Korean Academy of Conservative Dentistry

Journal of Korean Academy of Conservative Dentistry 2007; 32(5): 437-444.

Published online: 30 September 2007

DOI: https://doi.org/10.5395/JKACD.2007.32.5.437

Microleakage of 2-step adhesive systems in diamond-prepared cavity

Myung-Goo Lee, Kwon-Hwan Cho, Young-Gon Cho

Department of Conservative Dentistry, College of Dentistry, Chosun University, Korea.

Corresponding Author: Young-Gon Cho. Department of Conservative Dentistry, College of Dentistry, Chosun University 421 Seosuk-dong, Dong-gu, Gwangju, 501-825, Korea. Tel: 82-62-220-3840, Fax: 82-62-232-9064, ygcho@chosun.ac.kr

Received 19 March 2007       Revised 10 April 2007       Accepted 27 June 2007

Copyright © 2007 Korean Academy of Conservative Dentistry

(open-access):

This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/3.0/) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The purpose of this study was to compare the marginal microleakage of different 2-step adhesive systems in Class V cavities prepared with different diamond points.
Forty Class V cavities were prepared with two different (coarse or fine) diamond points on cervical third of extracted molars. The occlusal and gingival margin of cavities was located in enamel and dentin, respectively. They were divided into one of four equal groups (n = 10) and ; Group 1-prepared with coarse diamond point (EX-41), restored with Single Bond and Z 250, Group 2-prepared with fine diamond piont (TF-21F), restored with Single Bond and Z 250, Group 3-prepared with coarse diamond point (EX-41), restored with Clearfil SE Bond and Clearfil AP-X, Group 4-prepared with fine diamond point (TF-21F), restored with Clearfil SE Bond and Clearfil AP-X.
Specimens were thermocycled, immersed in a 2% methylene blue solution for 24 hours, and bisected longitudinally. They were observed leakages at enamel and dentinal margins. Data were analyzed using Mann-Whitney and Wilcoxon signed ranked test.
In this study, marginal microleakage of Single Bond was not affected by type of diamond points. But Clearfil SE Bond showed higher marginal microleakage at both enamel and dentinal margin when Class V cavity was prepared with coarse diamond point.

Keywords: Microleakage, 2-step adhesive systems, Class V cavities, Diamond points, Dentinal margin

Figures and Tables

Table 1
Adhesive systems used in this study
jkacd-32-437-i001

Bis-GMA: Bispheneol-glycidyl methacrylate, HEMA: Hydroxyethylmethacrylate.

MDP: Methacyloyloxydecyl dihydrogen phophate

Table 2
Group classification by different diamond points and adhesive systems used in Class V cavity preparation
jkacd-32-437-i002
Table 3
Distribution of microleakage scores and mean rank at enamel margins
jkacd-32-437-i003

*: There was statistically significant difference between group 3 and other groups at p < 0.01 (Mann-Whitney test).

Table 4
Distribution of microleakage scores and mean rank at dentinal margins
jkacd-32-437-i004

*: There was statistically significant difference between group 3 and other groups at p < 0.01 (Mann-Whitney test).

Table 5
Statistical analysis between the microleakage on enamel and dentinal margins in each group by Wilcoxon signed ranked test
jkacd-32-437-i005

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