Journal List > J Korean Acad Periodontol > v.39(Suppl) > 1049815

Kim, Kim, Kim, and Lee: A morphologic evaluation of defects created by a piezoelectric ultrasonic scaler on casting gold alloy

Abstract

Purpose

In this study we evaluated the morphologic aspects of defects created by a piezoelectric ultrasonic scaler with scaler tip on casting gold alloy using scanning electron microscope (SEM) images and defect surface profiles.

Methods

54 blocks of type III casting gold alloy (Firmilay, Jellenko Inc, CA, USA) were scaled by a piezoelectric ultrasonic scaler (P-MAX, Satelec, France) with scaler tip (No. 1 tip) on a sledge device. 2-dimensional profiles of defects on all samples were investigated by a surface profilometer (a-Step 500, KLA-Tencor, CA, USA). The selected working parameters were lateral force (0.5 N, 1.0 N, 2.0 N), mode (P mode, S mode), and power setting (2, 4, 8). SEM images were obtained. Defect surface profiles were made on Microsoft Excel program using data obtained by a surface profilometer.

Results

Among P mode samples, there were similarities on defect surface profiles and SEM images regardless of lateral force. The defects created in P mode were narrow and shallow although the depth and the width increased as power setting changed low (2) to high (8). In P mode samples, the defect depth was the greatest when lateral force of 0.5 N was applied. However all the depths were smaller than 1 m. SEM images of Lateral force of 0.5 N, S mode, power setting 2 and 4 were similar to that of P mode, but the other SEM images of S mode showed discernible changes. Defect depth of S mode samples was the greatest when lateral force of 1.0 N was applied.

Conclusions

Within the limitations of this study, it can be concoluded that removing capability of piezoelectric scaler with scaler tip becomes maximized as power level becomes higher but the capability is restricted when excessive lateral force is applied on scaler tip.

Figures and Tables

Figure 1
Scanning electon microscope image of defects. A) lateral force 0.5 N, P mode, power setting 2, magnification ×50, B) lateral force 1.0 N, P mode, power setting 4, magnification ×50, C) lateral force 2.0 N, P mode, power setting 4, magnification ×48, D) lateral force 0.5 N, S mode, power setting 4, magnification ×47.
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Figure 2
Scanning electron microscope image of defects. A) lateral force 1.0 N, S mode, power setting 4, magnification ×50, B) lateral force 2.0 N, S mode, power setting 8, magnification ×49, C) lateral force 0.5 N, S mode, power setting 8, magnification X500, D) lateral force 1.0 N, S mode, power setting 4, magnification X500.
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Figure 3
Surface profile of defects created at P mode. A) lateral force 0.5 N, B) lateral force 1.0 N, C) lateral force 2.0 N. In the box, P2, P4 and P8 mean P mode power setting 2, P mode power setting 4 and P mode power setting 8, respectively.
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Figure 4
Surface profile of defects created at S mode. A) lateral force 0.5 N, B) lateral force 1.0 N, C) lateral force 2.0 N. In the box, S2, S4 and S8 mean S mode power setting 2, S mode power setting 4 and S mode power setting 8, respectively.
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Young-Sung Kim
https://orcid.org/http://orcid.org/0000-0003-2674-3649

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